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- Netherlands - Delft University of Technology via AcademicTransfer - Posted on: 1 July 2026
1 Jul 2026
Delft University of Technology (TU Delft) Research Field
Engineering » Electrical engineering
Engineering » Microengineering Researcher Profile
First Stage Researcher (R1) Application Deadline
24 Aug :59 (UTC) Country
Netherlands Type of Contract
Temporary Job Status
Not Applicable Hours Per Week
38.0 Is the job funded through the EU Research Framework Programme?
Not funded by a EU programme Is the Job related to staff position within a Research Infrastructure?
No
Offer Description
PhD Position: High resolution Transmission Electron Imaging in Scanning Electron Microscopy
As a PhD candidate at TU Delft, you will work closely with our industrial partner Delmic, a world-leading company in correlative and multimodal microscopy, to develop a proof-of-concept transmission electron projection column based on miniaturized electron-optical components. The ambition is to create a compact, cost-effective projection system that can be integrated into conventional SEMs, enabling high-resolution transmission imaging alongside complementary modalities such as light microscopy, cathodoluminescence, and focused ion beam processing. By combining the strengths of multiple imaging techniques within a single instrument, this technology has the potential to significantly expand the capabilities and accessibility of electron microscopy.
Working at the intersection of electron optics, MEMS technology, microscopy instrumentation, and imaging physics, you will design, simulate, fabricate, and experimentally validate a novel MEMS-based transmission electron projection column integrated inside an SEM. The project combines theoretical modelling, numerical simulations, hardware development, precision engineering, and experimental validation, providing a unique opportunity to contribute to the development...